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Fieldemission Scanning Electron Microscope

Analysis of microstructure of light metals down to nano range
Investigation of the local chemical composition, crystal structure and orientation of base material and intermetallic phases (EDX, EBSD)

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Metallographic investigations
Damage analysis
Phase identification
Dispersoid quantification
Texture analysis by EBSD

Technical Data

Manufacturer/model	Tescan Mira 3
Schottky electron emission source	highest resolution
Detectors	4-quadrant solid-state backscatter electron detector Everhart-Thornley detector InLens secondary electron detector Gatan OnPoint Backscatter electron detector for low acceleration voltages EDAX Octane Elect EDX detector (energy dispersive X-ray spectroscopy, 70 mm² SDD) Tescan Low vacuum secondary electron detector
EDAX Velocity Super EBSD camera	Electron backscatter diffraction with up to 4500 indexed points per second

Dr. Johannes Österreicher

Senior Scientist / Light Metals Technologies Ranshofen

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Overview

LKR Leichtmetallkompetenz- zentrum Ranshofen

Österreicher, J. A., Simson, C., Großalber, A., Frank, S., & Gneiger, S. (2021). Spatial lithium quantification by backscattered electron microscopy coupled with energy-dispersive X-ray spectroscopy. Scripta Materialia, 194, 113664. https://doi.org/10.1016/j.scriptamat.2020.113664

Österreicher, J. A., Grabner, F., Schiffl, A., Schwarz, S., & Bourret, G. R. (2018). Information depth in backscattered electron microscopy of nanoparticles within a solid matrix. Materials Characterization, 138, 145-153. https://doi.org/10.1016/j.matchar.2018.01.049

Österreicher, J. A., Kumar, M., Schiffl, A., Schwarz, S., Hillebrand, D., & Bourret, G. R. (2016). Sample preparation methods for scanning electron microscopy of homogenized Al-Mg-Si billets: A comparative study. Materials Characterization, 122, 63-69. https://doi.org/10.1016/j.matchar.2016.10.020

Joint Application Note with EDAX on Lithium Detection: https://www.edax.com/resources/application-notes/quantitative-mapping-of-lithium-in-the-sem-using-composition-by-difference-method