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Homepage  Fieldemission Scanning Electron Microscope

Fieldemission Scanning Electron Microscope

  • Analysis of microstructure of light metals down to nano range

  • Investigation of the local chemical composition, crystal structure and orientation of base material and intermetallic phases (EDX, EBSD)

Rasterelektronenmikroskop Anlage

©Tescan

Our Services

  • Metallographic investigations
  • Damage analysis
  • Phase identification
  • Dispersoid quantification
  • Texture analysis by EBSD

 

Technical Data

Manufacturer
  • Tescan
Schottky electron emission source
  • highest resolution
Detectors
  • 4-quadrant solid-state backscatter electron detector
  • Everhart-Thornley detector
  • InLens secondary electron detector
  • EDAX Octane Elect EDX detector (energy dispersive X-ray spectroscopy, 70 mm² SDD)
Hikari Super EBSD camera
  • electron backscatter diffraction

 

Portraitfoto von Johannes Österreicher

Dr. Johannes Österreicher

Senior Scientist / Light Metals Technologies Ranshofen

Factsheet

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[Translate to English:] LKR Standort

Overview

LKR Leichtmetallkompetenz- zentrum Ranshofen